FACTS provides complete web, sheet and film profile measurement and control systems, as well as upgrades and replacement of existing nuclear profile measurement systems. The FACTS Total Profile Control family includes an offering of integrated measurement technologies and scanning frame designs to accommodate your on-line measurement applications. On-line “fixed-point” measurement systems are also available.
Total Profile Control System
 The FACTS TPC 5001FS Total Profile Control System is designed specifically for the integration of scanning gauge measurement technologies to provide machine direction and cross direction control of sheet and film processes.
.
Measurement Systems
Nuclear and X-Ray Scanners
FACTS offers rugged 'O'-Frame and 'C'-Frame scanning systems that include Strongtium 90, Krypton 85 and Promethium 147 sources to cover the full range of product measurements.
.
Scanner Upgrades
The FACTS Scanner Upgrade Package provides a cost effective alternative to replacement of existing scanners. FACTS can upgrade the obsolete electronics on your existing scanner and re-use the source, detector and mechanical frame assembly.
Sheet and Film Thickness -Non-nuclear System
The FACTS SME Gauge is a non-nuclear
measurement scanning system that provides true thickness measurement for your
sheet or film application. In
conjunction with a precision reference roll, the SME Gauge incorporates an
optical micrometer and an eddy current sensor to perform precise single-sided
measurements.
.
Coating & Multi-Layer Film Thickness MeasurementThe FACTS CFT Gauge provides true thickness measurement of coatings, individual layers and total film thickness.
.
|
