FACTSprovides complete web and sheet profile measurement and control systems, as well as upgrades and replacement of existing nuclear profile measurement systems. Upgrading an existing profile measurement and control system is an easy and cost effective solution to obsolete electronics and software when the scanning frame itself is still servicable.
Profile Control System
Download Datasheet The FACTS TPC 5001FS Total Profile Control System is designed specifically for the integration of scanning gauge measurement for machine direction and cross direction control of sheet and film processes.
Coating Control System
Download Datasheet The FACTS TCC 5401 Total Coating Control System is designed specifically for the integration of scanning gauge measurement and control of coat and web weight or thickness in the machine direction as well as individual cross direction zones for the coating process.
Roofing Control System
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The FACTS TRC 5410 Total Roofing Control System is designed specifically for the integration of scanning gauge measurement and control of web weight in the machine direction as well as individual cross direction zones for the roofing coating process.
Scanner Upgrades
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For extruders needing improved gauge control, the FACTS Universal
Scanner Interface, or USI, is a scanning-frame controller developed by
FACTS to control the gauge head(s) position, read the detector
signal, perform all linearization and compensation, and control the
shutter. The USI sends linearized scan data to the appropriate FACTS'
console (Total Profile Control or TPC) system where the web profile is
displayed and any necessary control actions are determined to correct
the profile via closed loop and auto-die bolt control. The USI and TPC
systems permit FACTS to provide cost-effective, single-source new
systems and retrofits of older sheet and film lines that have scanners
in addition to the overall line controls.
The FACTS SME Gauge is a non-nuclear
measurement scanning system that provides true thickness measurement for your
sheet or film application.In
conjunction with a precision reference role, the SME Gauge incorporates an
optical micrometer and an eddy current sensor to perform precise single-sided
measurements.
Based upon Spectral Coherence Inteferometry, the Stradex sensor family allows FACTS to effectively measure thin films and coatings from 5µm to 300µm at production speeds. Non-contact, non-nuclear simultaneous measurements of individual layers and total thickness is performed on-line.
Total Line Control
FACTSprovides advanced total line control solutions that fully integrate the entire extrusion process from the feed systems through the wind-ups including all measurement subsystems such as web profile measurement - WITH full Auto Profile Control.